Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering (PUB-453)

PUB-453 · 2017 · Journal of Applied Physics¹

DOI

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Authors

• Gabriela Gonzalez Aviles (author)¹

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Sources

1. ORCID/Crossref discovery 2026-08-21; hardware_score=2; hits=['laser', 'x-?ray']. Archived source retained by Resource Map maintainers. View current source