Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering (PUB-453)

Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering (2017) is listed in the DePaul Resource Map with a link to the published version (Journal of Applied Physics).

PUB-453 · 2017 · Journal of Applied Physics¹

DOI

Publication landing page: authors, related facilities, grants, and sources.

Authors

• Gabriela Gonzalez Aviles (author)¹

Related facilities

• No facility links in records.

Related grants

• No grant links in records.

Sources

1. ORCID/Crossref discovery 2026-08-21; hardware_score=2; hits=['laser', 'x-?ray']. Archived source retained by Resource Map maintainers. View current source