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Reduced Thermal Conductivity in Ultrafast Laser Heated Silicon Measured by Time-Resolved X-ray Diffraction (PUB-150)

Reduced Thermal Conductivity in Ultrafast Laser Heated Silicon Measured by Time-Resolved X-ray Diffraction (PUB-150)

Reduced Thermal Conductivity in Ultrafast Laser Heated Silicon Measured by Time-Resolved X-ray Diffraction (2021) is listed in the DePaul Resource Map with a link to the published version (Crystals).

PUB-150 · 2021 · Crystals¹

Publication landing page: authors, related facilities, grants, and sources.

Authors

Eric Landahl (coauthor)¹

Pohang Light Source — documented, uses¹

No grant links in records.

Sources

By taking advantage of the dense 500 MHz standard fill pattern in the PLS-II storage ring, we perform high angular-resolution X-ray diffraction measurements. Archived source retained by Resource Map maintainers. View current source