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Reduced Thermal Conductivity in Ultrafast Laser Heated Silicon Measured by Time-Resolved X-ray Diffraction (PUB-150)

PUB-150 · 2021 · Crystals1

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  1. By taking advantage of the dense 500 MHz standard fill pattern in the PLS-II storage ring, we perform high angular-resolution X-ray diffraction measurements. Archived source retained by Resource Map maintainers. View current source