Measuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering (PUB-627)
PUB-627 · 2018 · Applied Physics Letters1
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Authors
- Eric Landahl (author)1
Related facilities
- Advanced Photon Source — supporting, mentions1
- Argonne National Laboratory — supporting, mentions1
- Pohang Light Source — supporting, mentions1
Related grants
- No grant links in registry.
Sources
- priority fulltext wave promote. Archived source retained by Resource Map maintainers. View current source