Measuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering (PUB-627)

Measuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering (2018) is listed in the DePaul Resource Map with a link to the published version (Applied Physics Letters).

PUB-627 · 2018 · Applied Physics Letters¹

DOI

Publication landing page: authors, related facilities, grants, and sources.

Authors

• Eric Landahl (author)¹

Related facilities

• Advanced Photon Source — supporting, mentions¹
• Argonne National Laboratory — supporting, mentions¹
• Pohang Light Source — supporting, mentions¹

Related grants

• No grant links in records.

Sources

1. Named in published work. Archived source retained by Resource Map maintainers. View current source